Under Construction
Facilities and Equipment
X-Ray Photoelectron Spectroscopy
Kratos Axis Ultra DLD X-ray and ultraviolet photoelectron spectroscopy (XPS/UPS) system with in-situ transfer of samples from two sample preparation chambers (currently equipped with thermal evaporation and chemical vapor deposition/atomic layer deposition capabilities). The system is configured with a dual anode Mg/Al X-ray source, helium UV source, charge neutralizer, and Ar+ sputtering gun for depth profiling and is capable of small spot analysis of 15 μm, surface imaging, as well as angle-resolved XPS. The system enables surface-sensitive quantification of atomic composition and characterization of local chemical bonding, as well as a range of surface and interface electronic structure studies (valence band electronic structure, band lineup…).
Atomic Force Microscopy
Bruker MultiMode 8 atomic force microscope with PeakForce-TUNA interfaced with the Bruker Nasoscope analysis toolkit for atomic-scale imaging of surfaces. It offers PeakForce ScanAsyst, contact, and tapping mode imaging and can be configured with a variety of different modules for electrical, mechanical, and magnetic property characterization.