Valence and conduction band offsets at amorphous hexagonal boron nitride interfaces with silicon network dielectrics

King, S. W.; Paquette, M. M.; Otto, J. W.; Caruso, A.; Brockman, J.; Bielefeld, J.; French, M.; Kuhn, M.; French, B. Valence and conduction band offsets at amorphous hexagonal boron nitride interfaces with silicon network dielectrics. Applied Physics Letters 2014, 104 (10), 102901.