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Dhungana, Shailesh, Bradley J Nordell, Anthony N Caruso, Michelle M Paquette, William A Lanford, Kris Scharfenberger, Danya Jacob, and Sean W King. 2016. “Combinatorial Survey of Fluorinated Plasma Etching in the Silicon-Oxygen-Carbon-Nitrogen-Hydrogen System”. Journal of Vacuum Science & Technology A 34 (6): 061302.

Nordell, Bradley J, Thuong D Nguyen, Anthony N Caruso, Sudhaunshu S Purohit, Nathan A Oyler, William A Lanford, David W Gidley, et al. 2017. “Carbon-Enriched Amorphous Hydrogenated Boron Carbide Films for Very-Low-K Interlayer Dielectrics”. Advanced Electronic Materials 3 (12): 1700116.

Paquette, Michelle M, Daniel Plaul, Aiko Kurimoto, Brian O Patrick, and Natia L Frank. 2018. “Opto-Spintronics: Photoisomerization-Induced Spin State Switching at 300 K in Photochrome Cobalt—dioxolene Thin Films”. Journal of the American Chemical Society 140 (44): 14990-0.

Wisbey, David S, Michael R Vissers, Jiansong Gao, Jeff S Kline, Martin O Sandberg, Martin P Weides, MM Paquette, et al. 2019. “Dielectric Loss of Boron-Based Dielectrics on Niobium Resonators”. Journal of Low Temperature Physics 195: 474-86.

Braun, Jeffrey L, Sean W King, Eric R Hoglund, Mehrdad Abbasi Gharacheh, Ethan A Scott, Ashutosh Giri, John A Tomko, et al. 2021. “Hydrogen Effects on the Thermal Conductivity of Delocalized Vibrational Modes in Amorphous Silicon Nitride (a-SiNx:H)”. Physical Review Materials 5 (3): 035604.

Nordell, Bradley J, Thuong D Nguyen, Anthony N Caruso, William A Lanford, Patrick Henry, Han Li, Liza L Ross, Sean W King, and Michelle M Paquette. 2019. “Topological Constraint Theory Analysis of Rigidity Transition in Highly Coordinate Amorphous Hydrogenated Boron Carbide”. Frontiers in Materials [Special Edited Collection: Topology of Disordered Networks and Their Applications (Eds. P. Boolchand and M. Micoulaut)] 6: 264.

King, S W, J Plombon, J Bielefeld, J Blackwell, S Vyas, R Chebiam, C Naylor, et al. 2020. “A Selectively Colorful yet Chilly Perspective on the Highs and Lows of Dielectric Materials for CMOS Nanoelectronics”. 2020 IEEE International Electron Devices Meeting (IEDM), 40.1.1-40.1.4.